DocumentCode
1881259
Title
Technology road map for high frequency integrated DC-DC converter
Author
Li, Qiang ; Lim, Michele ; Sun, Julu ; Ball, Arthur ; Ying, Yucheng ; Lee, Fred C. ; Ngo, K.D.T.
Author_Institution
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear
2010
fDate
21-25 Feb. 2010
Firstpage
533
Lastpage
539
Abstract
This preliminary road map is provided for state-of-the-art technologies and trends toward integration of point-of-load converters. This paper encompasses an extended survey of literature ranging from device technologies and magnetic materials to integration technologies and approaches. The paper is organized into three main sections. 1) Device technologies, including the trench MOSFET, lateral MOSFET and lateral trench MOSFET, are discussed along with their intended applications. The critical role of device packaging to high-frequency integration is assessed. 2) Magnetic materials: In recent years, a number of new magnetic materials have been explored in various research labs to facilitate magnetic integration for high-frequency POL applications. These data are collected and organized to help selecting magnetic material for various current levels and frequency ranges. 3) Levels of integration, which are defined with the focus on magnetic integration techniques and approaches, namely board-level, package-level and wafer-level, each with suitable current scale and frequency range.
Keywords
DC-DC power convertors; MOSFET; magnetic materials; wafer level packaging; high frequency DC-DC converter; integrated DC-DC converter; lateral MOSFET; magnetic integration; magnetic materials; package level; point-of-load converters; technology road map; trench MOSFET; wafer level; DC-DC power converters; Electricity supply industry; Frequency conversion; MOSFET circuits; Magnetic analysis; Magnetic materials; Packaging; Roads; Sun; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
Conference_Location
Palm Springs, CA
ISSN
1048-2334
Print_ISBN
978-1-4244-4782-4
Electronic_ISBN
1048-2334
Type
conf
DOI
10.1109/APEC.2010.5433619
Filename
5433619
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