• DocumentCode
    1881353
  • Title

    Bayesian-based parameter estimation of K distribution using method of logarithmic cumulants

  • Author

    Cui, Yi ; Yamaguchi, Yoshio ; Yang, Jian

  • Author_Institution
    Fac. of Eng., Niigata Univ., Niigata, Japan
  • fYear
    2012
  • fDate
    12-15 Aug. 2012
  • Firstpage
    162
  • Lastpage
    166
  • Abstract
    In this paper, the problem of using the method of logarithmic cumulants (MoLC) for parameter estimation of the K distribution is addressed. Specifically, we have pointed out that the MoLC is likely to suffer from non-invertible equations. In order to overcome such difficulty, a prior distribution is introduced to the estimated term in the log-cumulant equation and closed-form Bayesian estimation is obtained. Numerical experiments demonstrate that this approach not only provides an always-solvable equation, but also universally improves the estimation accuracy. Finally, the application of the MoLC for ship detection in synthetic aperture radar (SAR) images is demonstrated. Experimental results with the RADARSAT-2 data show that the proposed method leads to better sea clutter modeling in terms of more accurate constant false alarm rate (CFAR) control.
  • Keywords
    Bayes methods; parameter estimation; radar detection; radar imaging; ships; statistical distributions; synthetic aperture radar; Bayesian-based parameter estimation; K distribution; RADARSAT-2 data; SAR images; closed-form Bayesian estimation; constant false alarm rate control; estimation accuracy; log-cumulant equation; logarithmic cumulants; noninvertible equations; sea clutter modeling; ship detection; synthetic aperture radar; Bayesian methods; Clutter; Equations; Estimation; Mathematical model; Shape; Synthetic aperture radar; Bayesian estimation; K distribution; constant false alarm rate; method of logarithmic cumulants; synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing, Communication and Computing (ICSPCC), 2012 IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4673-2192-1
  • Type

    conf

  • DOI
    10.1109/ICSPCC.2012.6335611
  • Filename
    6335611