• DocumentCode
    1881817
  • Title

    The effects of channel width tapering on the power dissipation of serially connected MOSFET

  • Author

    Friedman, Eby G.

  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    2110
  • Lastpage
    2113
  • Keywords
    Delay effects; Integrated circuit synthesis; MOS devices; MOSFET circuits; Parasitic capacitance; Power MOSFET; Power dissipation; Power supplies; Propagation delay; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    IEEE
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    693098
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1881817