Title :
Selecting Test Frequencies for Two-Tone Phase Plane analysis of ADCs, Part II
Author :
Blair, Jerome J.
Author_Institution :
Bechtel Nevada, Las Vegas, NV
Abstract :
A method for selecting test frequencies for two-tone phase plane modeling of ADCs is given. The results here include and generalize the results of a previous paper on the subject. The new results show how to select a good frequency pair that is near any two specified frequencies. An error analysis is given showing how close the actual test frequencies must be to their ideal values in order to maintain near-optimal phase plane coverage
Keywords :
analogue-digital conversion; circuit testing; ADC testing; distortion compensation; error analysis; frequency pair; test frequency selection; two-tone phase plane modeling; two-tone tests; Analog-digital conversion; Character recognition; Circuit testing; Error analysis; Frequency conversion; Instrumentation and measurement; Phase distortion; Sampling methods; Signal analysis; Signal generators; analog-to-digital converter (ADC) testing; distortion compensation; phase plane; two-tone tests;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328245
