• DocumentCode
    1881939
  • Title

    Large Area Silicon Carbide Vertical Junction Field Effect Transistors for High Temperature Power Conditioning Applications

  • Author

    Veliadis, Victor ; McNutt, Ty ; McCoy, Megan ; Hearne, Harold ; Potyraj, Paul ; Scozzie, Charles

  • Author_Institution
    Northrop Grumman Corp., Linthicum, MD
  • fYear
    2007
  • fDate
    9-12 Sept. 2007
  • Firstpage
    223
  • Lastpage
    229
  • Abstract
    SiC VJFETs are excellent candidates for reliable high power/temperature switching as they only use PN junctions in the active device area where the high electric fields occur. VJFETs do not suffer from forward voltage degradation, exhibit excellent short circuit performance, and operate at 300degC. 0.19 cm2 1200 V normally-on and 0.15 cm2 low-voltage normally- off VJFETs were fabricated. The 1200 V VJFET outputs 53 A with a forward drain voltage drop of 2 V and a low specific on-state resistance of 5.6 mOmega cm2. The low-voltage VJFET outputs 38 A with a forward drain voltage drop of 3 V and a specific on- state resistance of 10 mOmega cm2. The 1200 V SiC VJFET was connected in the cascode configuration with a Si MOSFET and with a low-voltage SiC VJFET to form normally-off power switches. At a forward drain voltage drop of 2 V, the SiC/MOSFET cascode switch outputs 31 A and the all-SiC cascode switch outputs 19 A.
  • Keywords
    elemental semiconductors; high-temperature electronics; junction gate field effect transistors; power MOSFET; power semiconductor switches; semiconductor device reliability; silicon; silicon compounds; wide band gap semiconductors; MOSFET; Si; SiC; VJFET; current 19 A; current 31 A; current 38 A; current 53 A; electric fields; forward drain voltage drop; high temperature switching; power conditioning application; vertical junction field effect transistor; voltage 1200 V; Circuit optimization; Degradation; FETs; MOSFET circuits; Power MOSFET; Power conditioning; Silicon carbide; Switches; Temperature; Voltage; 1200 V blocking; Vertical junction field effect transistor; cascode switch; power transistors; silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicle Power and Propulsion Conference, 2007. VPPC 2007. IEEE
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-0-7803-9760-6
  • Electronic_ISBN
    978-0-7803-9761-3
  • Type

    conf

  • DOI
    10.1109/VPPC.2007.4544129
  • Filename
    4544129