Title :
Multiple Fault Models for Timed FSMs
Author :
Batth, Samrat S. ; Uyar, M. Ü mit ; Wang, Yu ; Fecko, Mariusz A.
Author_Institution :
Dept. of Electr. Eng., City Univ. of New York, NY
Abstract :
An implementation under test (IUT) can be formally described using finite-state machines (FSMs). Due to the presence of inherent timing constraints and variables in a communication protocol, an IUT is modeled more accurately by using extended finite-state machines (EFSMs). However, infeasible paths due to the conflicts among timing condition and action variables of EFSMs can complicate the test generation process. The fault detection capability of the graph augmentation method given in M. U. Uyar et al. (2005) and M. A. Fecko et al. (2000) are analyzed in the presence of multiple timing faults. The complexity increases with the consideration of the concurrent running and expiring of timers in a protocol. It is proven that, by using our graph augmentation models, a faulty IUT will be detected for the multiple occurrences of pairwise combinations of a class of timing faults
Keywords :
automatic test pattern generation; directed graphs; fault diagnosis; finite state machines; timing; communication protocol; conformance testing; fault detection; finite-state machines; graph augmentation; implementation under test; multiple fault models; multiple timing faults; test generation; timed automata; timing constraints; Automata; Automatic testing; Cities and towns; Educational institutions; Fault detection; Instrumentation and measurement; Protocols; Timing; Upper bound; Conformance Testing; EFSMs; Extended FSMs; Fault Modeling; Simple Faults; Timed Automata; Timers;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328260