• DocumentCode
    1882030
  • Title

    The Performance Vulnerability of Architectural and Non-architectural Arrays to Permanent Faults

  • Author

    Hardy, Damien ; Sideris, Isidoros ; Ladas, N. ; Sazeides, Yiannakis

  • Author_Institution
    Univ. of Cyprus, Nicosia, Cyprus
  • fYear
    2012
  • fDate
    1-5 Dec. 2012
  • Firstpage
    48
  • Lastpage
    59
  • Abstract
    This paper presents a first-order analytical model for determining the performance degradation caused by permanently faulty cells in architectural and non-architectural arrays. We refer to this degradation as the performance vulnerability factor (PVF). The study assumes a future where cache blocks with faulty cells are disabled resulting in less cache capacity and extra misses while faulty predictor cells are still used but cause additional mispredictions. For a given program run, random probability of permanent cell failure, and processor configuration, the model can rapidly provide the expected PVF as well as lower and upper PVF probability distribution bounds for an individual array or array combination. The model is used to predict the PVF for the three predictors and the last level cache, used in this study, for a wide range of cell failure rates. The analysis reveals that for cell failure rate of up to 1.5e-6 the expected PVF is very small. For higher failure rates the expected PVF grows noticeably mostly due to the extra misses in the last level cache. The expected PVF of the predictors remains small even at high failure rates but the PVF distribution reveals cases of significant performance degradation with a non-negligible probability. These results suggest that designers of future processors can leverage trade-offs between PVF and reliability to sustain area, performance and energy scaling. The paper demonstrates this approach by exploring the implications of different cell size on yield and PVF.
  • Keywords
    cache storage; reliability; statistical distributions; PVF probability distribution; cache block; cell failure rate; faulty cell; first-order analytical model; nonarchitectural array; nonnegligible probability; performance vulnerability factor; permanent cell failure; random probability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microarchitecture (MICRO), 2012 45th Annual IEEE/ACM International Symposium on
  • Conference_Location
    Vancouver, BC
  • ISSN
    1072-4451
  • Print_ISBN
    978-1-4673-4819-5
  • Type

    conf

  • DOI
    10.1109/MICRO.2012.14
  • Filename
    6493607