• DocumentCode
    1882101
  • Title

    Evolution with time of properties of the polytetrabromo-p phenylenediselenide doped with an halogen (Cl or I).

  • Author

    Bernede, J.C. ; Godoy, Andres ; Conan, A. ; Molinie, P. ; Safoula, G. ; Harzi, H.M. ; Diaz, Francesc

  • Author_Institution
    Universite de Nantes
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    72
  • Lastpage
    72
  • Abstract
    Summary form only given. PBrPdSe has been doped by chlorine or iodine. The samples have been studied by X ray photoelectron spectroscopy (XPS), electron spin resonance (E.S.R.) and with a scanning electron microscope equiped with an electronic microprobe. Conductivity measurements have also been performed on pressed pellet samples, at room temperature. In the case of chlorine doped polymer, it is shown by XPS study that chlorine decomposes progressively the polymer. This result is corrobored by ESR study. The conductivity of the I/sub 2/ doped PBrPdSe exhibits an increase by about three orders of magnitude. The doping concentration decreases with time from 30 at % to 5 at % but the ESR signal stays the same. The high value of g anisotropy and the XPS peak of Se show that the positive charge is localized on the Se atoms. The binding energy of the iodine anion corresponds to I/sup - //sub 5/ species after doping and to I/sup -/sub 3/ thirteen months later. All these results can be explained by the reaction I/sup -//sub 5/ /spl rarr/I/sub 2/ + I/sup -//sub 3/. The I/sub 2/ removing explains the decrease of the iodine concentration and the I/sup -//sub 3/ formation explains the 3 stability of the ESR signal. The microphotograph show that the surface of the fibrils of iodine doped powder become rough with time this may be explained by I/sub 2/ removing and surface modification. These modifications can explain the decrease with time of the conductivity.
  • Keywords
    Conductivity measurement; Doping; Paramagnetic resonance; Performance evaluation; Photoelectron microscopy; Polymers; Rough surfaces; Scanning electron microscopy; Spectroscopy; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.834759
  • Filename
    834759