DocumentCode
1882262
Title
Living with Failure: Lessons from Nature?
Author
Furber, Steve
Author_Institution
University of Manchester, UK
fYear
2006
fDate
21-24 May 2006
Firstpage
4
Lastpage
8
Abstract
The resources available on a chip continue to grow, following Moore´s Law. However, the major process by which the benefits of Moore´s Law accrue, which is the continuing reduction in feature size, is predicted to bring with it disadvantages in terms of device reliability and parameter variability. The problems that this will bring are underlined by the predictions from an Intel commentator: within a decade we will see 100 billion transistor chips. That is the good news. The bad news is that 20 billion of those transistors will fail in manufacture and a further 10 billion will fail in the first year of operation.
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location
Southampton
Print_ISBN
0-7695-2566-0
Type
conf
DOI
10.1109/ETS.2006.28
Filename
1628146
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