• DocumentCode
    1882262
  • Title

    Living with Failure: Lessons from Nature?

  • Author

    Furber, Steve

  • Author_Institution
    University of Manchester, UK
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Firstpage
    4
  • Lastpage
    8
  • Abstract
    The resources available on a chip continue to grow, following Moore´s Law. However, the major process by which the benefits of Moore´s Law accrue, which is the continuing reduction in feature size, is predicted to bring with it disadvantages in terms of device reliability and parameter variability. The problems that this will bring are underlined by the predictions from an Intel commentator: within a decade we will see 100 billion transistor chips. That is the good news. The bad news is that 20 billion of those transistors will fail in manufacture and a further 10 billion will fail in the first year of operation.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ETS '06. Eleventh IEEE European
  • Conference_Location
    Southampton
  • Print_ISBN
    0-7695-2566-0
  • Type

    conf

  • DOI
    10.1109/ETS.2006.28
  • Filename
    1628146