Title :
Thermal measurements by use of a SBIMOS diode matrix
Author :
Geeraerts, B. ; Van Petegem, W. ; Sansen, W.
Abstract :
The diode matrix is shown to be an excellent tool for determining thermal constants and temperature distributions on chip. This information can be used to evaluate the electro-thermal simulator and to provide designers with more practical guidelines in designing chips with tight temperature specification. Temperature related problems on chip, such as offset voltage due to temperature gradients and maximum allowable temperature, can now be modeled adequately
Keywords :
MOS integrated circuits; circuit CAD; digital simulation; power integrated circuits; SBIMOS diode matrix; electro-thermal simulator; maximum allowable temperature; offset voltage; temperature distributions; temperature gradients; temperature specification; thermal constants; Calibration; Circuit simulation; Decoding; Diodes; Electromagnetic measurements; Process design; Resistors; Semiconductor device measurement; Temperature sensors; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1993. ICMTS 1993. Proceedings of the 1993 International Conference on
Conference_Location :
Sitges
Print_ISBN :
0-7803-0857-3
DOI :
10.1109/ICMTS.1993.292923
