• DocumentCode
    1882484
  • Title

    Design and comparison of digital control loops analytical models, laboratory measurements, and simulation results

  • Author

    Cooke, Philip ; Wilson, Thomas G., Jr. ; Samsi, Rohan

  • fYear
    2010
  • fDate
    21-25 Feb. 2010
  • Firstpage
    183
  • Lastpage
    187
  • Abstract
    A buck converter with a digital controller is modeled analytically and compared to laboratory measurements and simulation results. These models will help the practicing engineer in understanding the new digital controllers. This presentation provides engineers less familiar with digital control some tools and insight into how to characterize the behavior of these systems. The models are validated by comparing their results with experimental measurements. An analytical synthesis approach will be given to estimate the control loop PID values to design and assure the stability of these systems. This approach reduces design iteration and the resulting design can be further optimized in the laboratory and by way of the simulator. Additional simulation techniques and methods are presented which will help both young and more experienced engineers evaluate the robustness of these control systems. Finally, real life practical tips are provided to avoid common simulation and modeling traps.
  • Keywords
    circuit stability; control system synthesis; digital control; network synthesis; power convertors; simulation; three-term control; PID values; analytical models; buck converter; digital control loops; laboratory measurements; robustness; simulation; stability; Analytical models; Application specific integrated circuits; Buck converters; Communication system control; Digital control; Integrated circuit modeling; Laboratories; Mathematical model; Pulse width modulation converters; Transfer functions; Digital control; control loop modeling; power converter simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE
  • Conference_Location
    Palm Springs, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-4782-4
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2010.5433674
  • Filename
    5433674