• DocumentCode
    1882596
  • Title

    A Transparent based Programmable Memory BIST

  • Author

    Boutobza, Slimane ; Nicolaidis, Michael ; Lamara, Kheiredine M. ; Costa, Andrea

  • Author_Institution
    Synopsys Inc., Montbonnot
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Firstpage
    89
  • Lastpage
    96
  • Abstract
    We present an original transparent-based programmable memory BIST solution suitable for offline as well as online memory testing. Thanks to an appropriate combination of the test algorithm with the data backgrounds and by providing unlimited background flexibility, the proposed solution allows covering almost all existing fault models while increases the probability to also detect un-modeled faults
  • Keywords
    built-in self test; fault simulation; integrated circuit testing; integrated memory circuits; logic testing; programmable circuits; built-in self-test; data backgrounds; fault models; online memory testing; programmable memory BIST; unmodeled fault detection; Algorithm design and analysis; Built-in self-test; Circuit faults; Circuit testing; Costs; Fabrication; Fault detection; Process design; Random access memory; Read-write memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ETS '06. Eleventh IEEE European
  • Conference_Location
    Southampton
  • Print_ISBN
    0-7695-2566-0
  • Type

    conf

  • DOI
    10.1109/ETS.2006.7
  • Filename
    1628159
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1882596