DocumentCode
1882707
Title
Design aspects of industrial distribution systems to limit ARC flash hazard
Author
Das, J.C.
Author_Institution
PESrMIEEE Staff Consultant, AMEC Inc., Atlanta, GA
fYear
2005
fDate
23-23 June 2005
Firstpage
179
Lastpage
190
Abstract
The industrial distribution systems have been designed in USA, considering prevalent standards, i.e., ANSI, IEEE, NEC, OSHA etc. and the arc flash were not a consideration for designing electrical power systems in the industry. Functionality and economics were the important factors, and will always be so. However, the arc flash analysis and limiting the incident energy will usher a new parameter in the system design. It can be demonstrated that in many current installations and new installations designed without considerations of limiting the arc flash energy, the hazard risk category exceeds the highest Class 4 of PPE, i.e., ATPV (callcm2) of 40. This paper discusses typical industrial distribution systems at low-voltage and medium-voltage levels and demonstrates the impact of system design decisions and protection on the incident energy and arc flash hazard reduction
Keywords
arcs (electric); design engineering; electrical safety; hazards; industrial power systems; installation; power distribution economics; power distribution faults; power distribution protection; short-circuit currents; standards; ANSI; IEEE; NEC; OSHA; PPE class; USA; arc flash hazard; distribution system economics; electrical power system designing; hazard calculations; hazard reduction; industrial distribution systems; installations; limiting incident energy release; prevalent standards; short-circuit currents; system design protection; ANSI standards; Hazards; Industrial power systems; National electric code; Occupational safety; Power generation economics; Power system analysis computing; Power system economics; System analysis and design; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulp and Paper Industry Technical Conference, 2005. Conference Record of 2005 Annual
Conference_Location
Jacksonville, FL
Print_ISBN
0-7803-9089-X
Type
conf
DOI
10.1109/PAPCON.2005.1502064
Filename
1502064
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