Mixed Test Pattern Generation Using a Single Parallel LFSR

In this paper, new method is described to design a mixed-mode test pattern generator based only on a simple and single linear feedback shift register (LFSR). Such an LFSR synthesized by the Berlekamp-Massey algorithm is obtained in order to generate pre-computed deterministic test patterns to detect the hard-to-detect faults of the circuit. Among them, residual test patterns are generated to detect the others. Using the proposed method, a circuit can be tested at-speed and complete fault coverage is achieved with a small number of test patterns and small area overhead. The experimental results show that the proposed method compares favorably to other previous methods