• DocumentCode
    1882904
  • Title

    Fault Collapsing for Transition Faults Using Extended Transition Faults

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., Lafayette, IN
  • fYear
    2006
  • fDate
    21-24 May 2006
  • Firstpage
    173
  • Lastpage
    178
  • Abstract
    We present a fault collapsing procedure for transition faults based on fault dominance relations. The effectiveness of the procedure is enhanced by introducing what we call extended transition faults. A standard transition fault involves a single line and a transition. A transition fault from the value to the value a´ on a line g is represented as g = a rarr g = a´. An extended transition fault involves two different lines with arbitrary values, and it is represented as g1 = a1 rarr g2 = a´ 2. We demonstrate the importance of extended transition faults in fault collapsing, and describe two fault collapsing procedures. We consider the effects of fault collapsing on test generation
  • Keywords
    automatic test pattern generation; fault simulation; fault collapsing; fault dominance relations; test generation; transition faults; Circuit analysis; Circuit faults; Circuit testing; Cities and towns; Fault detection; Fault diagnosis; Functional analysis; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ETS '06. Eleventh IEEE European
  • Conference_Location
    Southampton
  • Print_ISBN
    0-7695-2566-0
  • Type

    conf

  • DOI
    10.1109/ETS.2006.22
  • Filename
    1628171