DocumentCode :
1882904
Title :
Fault Collapsing for Transition Faults Using Extended Transition Faults
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., Lafayette, IN
fYear :
2006
fDate :
21-24 May 2006
Firstpage :
173
Lastpage :
178
Abstract :
We present a fault collapsing procedure for transition faults based on fault dominance relations. The effectiveness of the procedure is enhanced by introducing what we call extended transition faults. A standard transition fault involves a single line and a transition. A transition fault from the value to the value a´ on a line g is represented as g = a rarr g = a´. An extended transition fault involves two different lines with arbitrary values, and it is represented as g1 = a1 rarr g2 = a´ 2. We demonstrate the importance of extended transition faults in fault collapsing, and describe two fault collapsing procedures. We consider the effects of fault collapsing on test generation
Keywords :
automatic test pattern generation; fault simulation; fault collapsing; fault dominance relations; test generation; transition faults; Circuit analysis; Circuit faults; Circuit testing; Cities and towns; Fault detection; Fault diagnosis; Functional analysis; Performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location :
Southampton
Print_ISBN :
0-7695-2566-0
Type :
conf
DOI :
10.1109/ETS.2006.22
Filename :
1628171
Link To Document :
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