DocumentCode
1882904
Title
Fault Collapsing for Transition Faults Using Extended Transition Faults
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., Lafayette, IN
fYear
2006
fDate
21-24 May 2006
Firstpage
173
Lastpage
178
Abstract
We present a fault collapsing procedure for transition faults based on fault dominance relations. The effectiveness of the procedure is enhanced by introducing what we call extended transition faults. A standard transition fault involves a single line and a transition. A transition fault from the value to the value a´ on a line g is represented as g = a rarr g = a´. An extended transition fault involves two different lines with arbitrary values, and it is represented as g1 = a1 rarr g2 = a´ 2. We demonstrate the importance of extended transition faults in fault collapsing, and describe two fault collapsing procedures. We consider the effects of fault collapsing on test generation
Keywords
automatic test pattern generation; fault simulation; fault collapsing; fault dominance relations; test generation; transition faults; Circuit analysis; Circuit faults; Circuit testing; Cities and towns; Fault detection; Fault diagnosis; Functional analysis; Performance analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ETS '06. Eleventh IEEE European
Conference_Location
Southampton
Print_ISBN
0-7695-2566-0
Type
conf
DOI
10.1109/ETS.2006.22
Filename
1628171
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