DocumentCode :
1882943
Title :
Study of the Normal Generalized Stochastic Petri nets and its Application in Testing System
Author :
Zhan, Huiqin ; Gu, Jun
Author_Institution :
Dept. of Autom., Univ. of Electron. Sci. & Technol., Chengdu
fYear :
2006
fDate :
24-27 April 2006
Firstpage :
1123
Lastpage :
1128
Abstract :
Study methodologies for application of Petri nets theory to the modeling and performance analysis of testing system. Current stochastic Petri nets theories under active research generally assume that the transition associated with random time coincides with negative exponential distribution. But testing system and its hardware circuits modeled after stochastic Petri nets do not match the assumption of negative exponential distribution, rather coincide with other distribution. Based on the fact, this paper proposed the definition and analysis methodologies of the normal generalized stochastic Petri net (NGSPN) in order to solve the Petri net state space explosion of complex system, the authors adopted a different approach to study reduction techniques of the basic Petri net components serial and parallel connection models, deduced the equivalent theorems of reducing the NGSPNs serial connection model proposed some approximate formulas for reducing the parallel connection model under several common scenarios through simulation. A concrete example is given for NGSPN modeling and serial and parallel connection reduction of a testing systems data acquisition card
Keywords :
Petri nets; data acquisition; stochastic processes; test equipment; Petri net state space explosion; data acquisition card; hardware circuits; negative exponential distribution; normal generalized stochastic Petri nets; parallel connection; performance analysis; serial connection; testing system modeling; Circuit testing; Explosions; Exponential distribution; Hardware; Performance analysis; Petri nets; State-space methods; Stochastic processes; Stochastic systems; System testing; Model Reduction; Normal Generalized Stochastic Petri net (NGSPN); Serial/Parallel Connection; Testing System Modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
ISSN :
1091-5281
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2006.328384
Filename :
4124513
Link To Document :
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