DocumentCode :
1883194
Title :
Acceptable bubble size in potting materials
Author :
Weil, Thomas
Author_Institution :
Raytheon Co., Wayland, MA, USA
fYear :
1990
fDate :
11-16 March 1990
Firstpage :
444
Lastpage :
447
Abstract :
Air gaps or bubbles within the solid insulation used in high-voltage power supplies are discussed. These bubbles can be a cause of failure if the AC voltage across the gap or bubble is sufficient to cause ionization (corona). If the bubbles are small enough, they will not be a problem because there will not be enough voltage across the gas to cause ionization to start. The purpose of this work is to show how small is small enough. The results should apply equally well to naturally occurring bubbles in other kinds of insulation such as paper, Teflon, Kapton, and other plastics. The problem was approached by running an electrostatic field stress program for bubbles occurring in potting (encapsulation) materials, with various values of dielectric constant. A typical case is shown. Cases were run not only for bubbles but also for transverse cylinders. It was found that the voltage stress factor for bubbles and cylinders is surprisingly low, and it stays low even for large values of relative dielectric constant. It is concluded that since the maximum voltage stress in the potting material does not exceed 200 V/mil. even locally, bubbles up to 0.75 mm should be acceptable.<>
Keywords :
corona; insulation testing; power supplies to apparatus; 0.75 mm; AC voltage; Kapton; Teflon; acceptable bubble size; air gaps; bubbles; corona; electrostatic field stress program; encapsulation materials; failure; high-voltage power supplies; ionization; paper; plastics; potting materials; relative dielectric constant; solid insulation; transverse cylinders; voltage stress factor; Air gaps; Corona; Dielectric constant; Dielectric materials; Insulation; Ionization; Power supplies; Solids; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1990. APEC '90, Conference Proceedings 1990., Fifth Annual
Conference_Location :
Los Angeles, CA, USA
Type :
conf
DOI :
10.1109/APEC.1990.66447
Filename :
66447
Link To Document :
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