DocumentCode :
1883700
Title :
Establishing a defect prediction model using a combination of product metrics as predictors via Six Sigma methodology
Author :
Suffian, Muhammad Dhiauddin Mohamed ; Abdullah, Mohamed Redzuan
Author_Institution :
Test Centre of Excellence (Test COE), MIMOS Berhad, Kuala Lumpur, Malaysia
Volume :
3
fYear :
2010
fDate :
15-17 June 2010
Firstpage :
1087
Lastpage :
1092
Abstract :
Defect prediction is an important aspect of the Product Development Life Cycle. The rationale in knowing predicted number of functional defects earlier on in the lifecycle, rather than to just find as many defects as possible during testing phase is to determine when to stop testing and ensure all the in-phase defects have been found in-phase before a product is delivered to the intended end user. It also ensures that wider test coverage is put in place to discover the predicted defects. This research is aimed to achieve zero known post release defects of the software delivered to the end user by MIMOS Berhad. To achieve the target, the research effort focuses on establishing a test defect prediction model using Design for Six Sigma methodology in a controlled environment where all the factors contributing to the defects of the product is within MIMOS Berhad. It identifies the requirements for the prediction model and how the model can benefit them. It also outlines the possible predictors associated with defect discovery in the testing phase. Analysis of the repeatability and capability of test engineers in finding defects are demonstrated. This research also describes the process of identifying characteristics of data that need to be collected and how to obtain them. Relationship of customer needs with the technical requirements of the proposed model is then clearly analyzed and explained. Finally, the proposed test defect prediction model is demonstrated via multiple regression analysis. This is achieved by incorporating testing metrics and development-related metrics as the predictors. The achievement of the whole research effort is described at the end of this study together with challenges faced and recommendation for future research work.
Keywords :
fault diagnosis; product life cycle management; regression analysis; six sigma (quality); MIMOS Berhad; customer needs; defect discovery; multiple regression analysis; product development life cycle; product metrics; six sigma methodology; technical requirements; test defect prediction model; test engineering; Equations; Mathematical model; Measurement; Predictive models; Regression analysis; Software; Testing; defect prediction; model; prediction model; six sigma; test defect; test defect prediction model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology (ITSim), 2010 International Symposium in
Conference_Location :
Kuala Lumpur
ISSN :
2155-897
Print_ISBN :
978-1-4244-6715-0
Type :
conf
DOI :
10.1109/ITSIM.2010.5561516
Filename :
5561516
Link To Document :
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