• DocumentCode
    1884228
  • Title

    Advanced memory technologies for space and missile systems applications

  • Author

    Doyle, Scott ; Ross, Jason ; Sturcken, Keith

  • Author_Institution
    BAE Syst., Manassas, VA, USA
  • fYear
    2012
  • fDate
    3-10 March 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Technology status and qualification test results are discussed on two new deep submicron radiation hardened devices including a 64Mb SRAM family and stacked MCM versions of the C-RAM non-volatile memory. Electrical characterization and radiation test results will be discussed.
  • Keywords
    missiles; radiation hardening (electronics); random-access storage; space vehicle electronics; C-RAM nonvolatile memory; SRAM family; advanced memory technologies; deep submicron radiation hardened devices; electrical characterization; missile systems applications; radiation test; space applications; stacked MCM; CMOS integrated circuits; Computer architecture; Microprocessors; Packaging; Radiation hardening; Random access memory; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2012 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    978-1-4577-0556-4
  • Type

    conf

  • DOI
    10.1109/AERO.2012.6187231
  • Filename
    6187231
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1884228