The Interaction Between Metrological Parameters and Industrial Process Simulation Requirements for Equipment Scale-Up/Down by means of Dimensional Analysis

Author

Batzias, Fragiskos A.

Author_Institution

Dept. of Ind. Manage. & Technol., Piraeus Univ.

fYear

2006

fDate

24-27 April 2006

Firstpage

1490

Lastpage

1495

Abstract

Industrial process scale up from laboratory to large scale by means of similarity theory and relevant techniques implies usually deviation of metrological parameter values, as a result of conditions changing. The present work deals with the design/development of an algorithmic procedure based on the interaction between metrological parameters and industrial process simulation for improving scale up by means of dimensional analysis when: (i) co-exists an engineering model; and (ii) no model has been reported so far in technical literature or practice. Implementation for both cases has been included

Keywords

algebra; manufacturing processes; semiconductor process modelling; dimensional analysis; engineering model; industrial process simulation; interval algebra; metrological parameters; Algorithm design and analysis; Analytical models; Computational modeling; Computer aided engineering; Computer simulation; Design automation; Laboratories; Large-scale systems; Merging; Metrology; dimensional analysis; interval algebra; metrology; scale-up/down; similarity;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE

Conference_Location

Sorrento

ISSN

1091-5281

Print_ISBN

0-7803-9359-7

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2006.328645

Filename

4124593