DocumentCode
1884896
Title
Developing an aphid damage hyperspectral index for detecting aphid (Hemiptera: Aphididae) damage levels in winter wheat
Author
Luo Juhua ; Wang Dacheng ; Dong Yingying ; Huang Wenjiang ; Wang Jindi
Author_Institution
State Key Lab. of Remote Sensing Sci., Beijing Normal Univ., Beijing, China
fYear
2011
fDate
24-29 July 2011
Firstpage
1744
Lastpage
1747
Abstract
Aphid (Hemiptera: Aphididae) appears in wheat planting area of China almost every year and have had significant economic impacts on wheat yield. As a result, large amounts of insecticides are used to control aphid populations, which may cause environmental pollution. Therefore, remote sensing as a repeatable and rapid method is necessary for monitoring aphid damage level. The study analyzed the hyperspectral characteristics of wheat infested by several aphid damage levels and selected out the sensitive bands to aphid damage levels, and the aphid damage hyperspectral index (ADHI) was developed based on the most sensitive bands to aphid damage levels in the visible, near-infrared and short-wave infrared regions. The results indicated that ADHI exhibited a high correlation with aphid damage levels (R2 =0.839), so it had the potential to detect wheat damage caused by aphid.
Keywords
agriculture; crops; vegetation mapping; ADHI; China; aphid damage hyperspectral index; aphid damage level monitoring; aphid detection; environmental pollution; family Aphididae; near infrared region; order Hemiptera; remote sensing; short wave infrared region; visible region; winter wheat; Agriculture; Green products; Hyperspectral sensors; Indexes; Reflectivity; Stress; Aphid; Damage Levels; Hyperspectral index; Sensitive Band; Winter wheat;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2011 IEEE International
Conference_Location
Vancouver, BC
ISSN
2153-6996
Print_ISBN
978-1-4577-1003-2
Type
conf
DOI
10.1109/IGARSS.2011.6049456
Filename
6049456
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