Title :
Measurable improvements in cycle-time-constrained capacity
Author :
Fowler, John W. ; Brown, Steven ; Gold, Hermann ; Schoeming, A.
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Abstract :
This study uses simulation-based analysis to evaluate the operating practices of a high-volume, multiple-product semiconductor fab, with the goal of finding potential areas for productivity improvement that will yield a quantifiable increase in fab capacity. The parameters setup, batching, tool/operator dedication, lot release, and dispatch rule were studied. The analysis revealed that some of the current operating practices of the factory were beneficial while changing some other practices would increase “cycle-time-constrained capacity” by up to 12%. A significant opportunity for potential improvement for this factory lies in implementing a strict setup avoidance policy. The first implementation in the actual fab is a relaxation of the photolithography equipment dedication which has helped the factory achieve a 25% reduction in cycle time and inventory
Keywords :
batch processing (industrial); integrated circuit manufacture; production control; simulation; batching; cycle-time-constrained capacity; dispatch rule; fab capacity improvement; high-volume semiconductor fabrication facility; lot release; multiple-product semiconductor fab line; operating practices; parameters setup; photolithography equipment dedication; productivity improvement; simulation-based analysis; tool/operator dedication; Analytical models; Constraint theory; Discrete event simulation; Gold; Lithography; Production facilities; Productivity; Throughput;
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3752-2
DOI :
10.1109/ISSM.1997.664485