Title :
The Histogram Test of ADCs is Unbiased by Phase Noise
Author :
Alegria, F. Corrâa ; Serra, A. Cruz
Author_Institution :
Inst. de Telecomunicacoes, Lisbon Tech. Univ., Lisboa
Abstract :
It is shown here that the presence of phase noise or jitter in the test setup or in the ADC itself does not cause a bias in the transfer function estimation using the histogram test. The ADC parameters that are related to its transfer function are the transition voltages, code bin widths, integral non linearity, differential non linearity, gain and offset error
Keywords :
analogue-digital conversion; circuit testing; phase noise; transfer functions; ADC parameters; analog-to-digital converter; code bin widths; differential nonlinearity; histogram test; integral nonlinearity; phase noise; transfer function; transition voltage; Analog-digital conversion; Clocks; Frequency; Histograms; Jitter; Phase noise; Sampling methods; Testing; Transfer functions; Voltage; Jitter; analog to digital converter; bias; histogram test; phase noise;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328186
