• DocumentCode
    1885780
  • Title

    Discovering Dynamic Developer Relationships from Software Version Histories by Time Series Segmentation

  • Author

    Siy, Harvey ; Chundi, Parvathi ; Rosenkrant, Daniel J. ; Subramaniam, Mahadevan

  • Author_Institution
    Univ. of Nebraska at Omaha, Omaha
  • fYear
    2007
  • fDate
    2-5 Oct. 2007
  • Firstpage
    415
  • Lastpage
    424
  • Abstract
    Time series analysis is a promising approach to discover temporal patterns from time stamped, numeric data. A novel approach to apply time series analysis to discern temporal information from software version repositories is proposed. Version logs containing numeric as well as non-numeric data are represented as an item-set time series. A dynamic programming based algorithm to optimally segment an item-set time series is presented. The algorithm automatically produces a compacted item-set time series that can be analyzed to discern temporal patterns. The effectiveness of the approach is illustrated by applying to the Mozilla data set to study the change frequency and developer activity profiles. The experimental results show that the segmentation algorithm produces segments that capture meaningful information and is superior to the information content obtaining by arbitrarily segmenting time period into regular time intervals.
  • Keywords
    configuration management; data mining; dynamic programming; software maintenance; software quality; time series; data mining; dynamic developer relationship discovery; dynamic programming algorithm; item-set time series; software development; software maintenance; software quality; software version repository; temporal pattern discovery; time series segmentation; version history logs; Data analysis; Dynamic programming; Frequency; Heuristic algorithms; History; Information analysis; Pattern analysis; Performance analysis; Time measurement; Time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance, 2007. ICSM 2007. IEEE International Conference on
  • Conference_Location
    Paris
  • ISSN
    1063-6773
  • Print_ISBN
    978-1-4244-1256-3
  • Electronic_ISBN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2007.4362654
  • Filename
    4362654