DocumentCode :
1885830
Title :
Evaporated nanostructured Y2O3:Eu thin films
Author :
Hrudey, P.C.P. ; Taschuk, M. ; Tsui, Y.Y. ; Fedosejevs, R. ; Sit, J.C. ; Brett, M.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, Canada
fYear :
2003
fDate :
20-23 July 2003
Firstpage :
327
Lastpage :
331
Abstract :
Europium-doped yttrium oxide (Y2O3:Eu) is a well-known luminescent material that has been experimented with in recent years in thin film form. However, to date there has not been a great effort put into altering the nanostructure of these films. A thin film deposition technique called glancing angle deposition (GLAD) allows for a high degree of control over the nanostructure of the thin film, resulting in thin films with nanostructures ranging from chevrons and posts to helices. GLAD was used here to make europium-doped yttrium oxide thin films with different nanostructures. Scanning electron microscopy was then used to characterize the nanostructures of the films, while UV excitation was used to characterize the photoluminescence properties of the films.
Keywords :
europium; nanostructured materials; photoluminescence; scanning electron microscopy; thin films; vacuum deposited coatings; yttrium compounds; UV excitation; Y2O3:Eu; Y2O3:Eu thin films; europium-doped yttrium oxide; evaporated nanostructure; glancing angle deposition; luminescent material; photoluminescence properties; scanning electron microscopy; Flat panel displays; Optical films; Phosphors; Powders; Rough surfaces; Sputtering; Substrates; Surface roughness; Transistors; Yttrium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MEMS, NANO and Smart Systems, 2003. Proceedings. International Conference on
Print_ISBN :
0-7695-1947-4
Type :
conf
DOI :
10.1109/ICMENS.2003.1222019
Filename :
1222019
Link To Document :
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