Measurement of the conductivity exponent in random percolating networks of nanoscale bismuth clusters

Author

Dunbar, A.D.F. ; Partridge, J.G. ; Schulze, M. ; Scott, S. ; Brown, S.A.

Author_Institution

Dept. of Phys. & Astron., Canterbury Univ., Christchurch, New Zealand

fYear

2003

fDate

20-23 July 2003

Firstpage

350

Lastpage

356

Abstract

Nanoscale bismuth clusters, produced in an inert gas aggregation source, have been deposited between lithographically defined electrical contacts. The conductivity exponent, t, of the 2D percolating network of bismuth clusters has been derived from in-situ electrical measurements. It was found to be 1.32±0.25. This value is comparable with theoretical predictions of t ·1.3 for 2D random continuum percolation networks.

Keywords

aggregation; bismuth; chromium alloys; electrical conductivity; gold; metallic thin films; nanocontacts; nanostructured materials; nickel alloys; ohmic contacts; percolation; photolithography; vapour deposition; Bi; NiCr-Au; SiN; electrical contacts; electrical properties; inert gas aggregation source; lithography; nanoscale bismuth clusters; random 2D percolating networks; Assembly; Atomic layer deposition; Bismuth; Conductivity measurement; Contacts; Extraterrestrial measurements; Fabrication; Intelligent networks; Lattices; Nanowires;

fLanguage

English

Publisher

ieee

Conference_Titel

MEMS, NANO and Smart Systems, 2003. Proceedings. International Conference on

Print_ISBN

0-7695-1947-4

Type

conf

DOI

10.1109/ICMENS.2003.1222023

Filename

1222023