Title :
Measurement of the conductivity exponent in random percolating networks of nanoscale bismuth clusters
Author :
Dunbar, A.D.F. ; Partridge, J.G. ; Schulze, M. ; Scott, S. ; Brown, S.A.
Author_Institution :
Dept. of Phys. & Astron., Canterbury Univ., Christchurch, New Zealand
Abstract :
Nanoscale bismuth clusters, produced in an inert gas aggregation source, have been deposited between lithographically defined electrical contacts. The conductivity exponent, t, of the 2D percolating network of bismuth clusters has been derived from in-situ electrical measurements. It was found to be 1.32±0.25. This value is comparable with theoretical predictions of t ·1.3 for 2D random continuum percolation networks.
Keywords :
aggregation; bismuth; chromium alloys; electrical conductivity; gold; metallic thin films; nanocontacts; nanostructured materials; nickel alloys; ohmic contacts; percolation; photolithography; vapour deposition; Bi; NiCr-Au; SiN; electrical contacts; electrical properties; inert gas aggregation source; lithography; nanoscale bismuth clusters; random 2D percolating networks; Assembly; Atomic layer deposition; Bismuth; Conductivity measurement; Contacts; Extraterrestrial measurements; Fabrication; Intelligent networks; Lattices; Nanowires;
Conference_Titel :
MEMS, NANO and Smart Systems, 2003. Proceedings. International Conference on
Print_ISBN :
0-7695-1947-4
DOI :
10.1109/ICMENS.2003.1222023
