Development of a Measuring Device for the Parasitic Inductance of the DC-link Backplane of an Inverter

Author

Bolsens, Bruno ; Van den Keybus, Jeroen ; Driesen, Johan ; Belmans, Ronnie

Author_Institution

Dept.of Electr. Eng., Catholic Univ. Leuven

fYear

2006

fDate

24-27 April 2006

Firstpage

1721

Lastpage

1724

Abstract

Four different design options are investigated for a DC-link backplane of an inverter. The backplanes interconnect switches and capacitors and have slots at various positions. The purpose is to evaluate the performance of the four topologies regarding parasitic inductance. A probe is developed to measure these low inductances. The probe is powered from a high-frequency source and is connected to a digital oscilloscope through four differential measurements. The measurements are compared with numerical simulations calculating the inductance with the method of moments. The simulations and the measurements yield similar results

Keywords

inductance measurement; invertors; method of moments; DC-link backplane; digital oscilloscope; interconnect capacitors; interconnect switches; inverters; method of moments; parasitic inductance; Backplanes; Capacitors; Inductance measurement; Inverters; Moment methods; Numerical simulation; Oscilloscopes; Probes; Switches; Topology; DC-link; backplane; high switching frequencies; inverter; low inductance; parasitic inductance; parasitics; probing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE

Conference_Location

Sorrento

ISSN

1091-5281

Print_ISBN

0-7803-9359-7

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2006.328218

Filename

4124643