DocumentCode
1886091
Title
Improving cycle time through managing variability in a DRAM production line
Author
Majorana, A. ; Iuliano, Guglielmo
Author_Institution
Texas Instrum., Avezzano, Italy
fYear
1997
fDate
6-8 Oct 1997
Abstract
The authors describe the process adopted to improve productivity in terms of cycle time decrease in a DRAM wafer fab (AMOS, Texas Instruments Italy). In order to arrange the structural and managerial factors influencing the cycle time of products, an integrated approach aimed to contain the variability is outlined. Such a process generated a 30% cycle time reduction in 1996 with a remarkable impact on the operating performance of the factory
Keywords
DRAM chips; integrated circuit manufacture; production control; DRAM production line; cycle time improvement; factory operating performance; productivity improvement; variability management; Equations; Instruments; Manufacturing; Production facilities; Productivity; Random access memory; Semiconductor device manufacture; Steady-state; Testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-3752-2
Type
conf
DOI
10.1109/ISSM.1997.664487
Filename
664487
Link To Document