Next generation test generator (NGTG) for analog circuits

Author

Venetsky, L. ; Singer, S.

Author_Institution

Aircraft Div., Naval Air Warfare Center, Lakehurst, NJ, USA

fYear

1997

fDate

22-25 Sep 1997

Firstpage

113

Lastpage

120

Abstract

This paper describes a system that automatically generates tests for an analog Unit Under Test (UUT) in learning mode, and then deploys the system for fault detection and isolation in the production mode. The NGTG consists of the following main components: a) minimized input test pattern generator, b) UUT simulator, and last but not least c) evaluation system. The NGTG is a process that utilizes Fuzzy Artmap neural network for fault diagnostics and detection and genetic algorithm for test generation and fault coverage optimization

Keywords

analogue circuits; automatic test equipment; automatic testing; electronic equipment testing; fault location; fuzzy logic; genetic algorithms; learning (artificial intelligence); production testing; software engineering; Fuzzy Artmap neural network; Learning Mode; NGTG; UUT simulator; Unit Under Test; analog circuits; evaluation; fault coverage optimization; fault detection; fault diagnostics; fault isolation; genetic algorithm; gyroscope; minimized input test pattern generator; servo controller; test generation; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fuzzy neural networks; Production systems; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-4162-7

Type

conf

DOI

10.1109/AUTEST.1997.633580

Filename

633580