DocumentCode :
1886540
Title :
Influence of temperature and strain on phase growth process in Sn-3.0Ag-0.5Cu solder joints
Author :
Mori, Takao ; Ejiri, Yasuhiro ; Sayama, Toshihiko ; Talayanagi, Takeshi ; Okamoto, Yoshiyuki ; Yu, Qiang
Author_Institution :
Dept. of Mech. Syst. Eng., Toyama Prefectural Univ., Toyama
fYear :
2008
fDate :
28-31 May 2008
Firstpage :
652
Lastpage :
659
Abstract :
This paper describes the phase growth of Sn-3.0Ag- 0.5Cu solder joints by mechanical cyclic loading. The objective of this paper is to clear the influence of temperature and strain to the phase growth. It is very important to evaluate the life time of crack initiation in Sn-3.0Ag-0.5Cu solder joints under thermal cycles. A mini-lap joint type shear specimen was used to evaluate the influence of temperature and strain on the phase growth of solder joints. The mechanical cyclic loading was carried out under a constant temperature condition. The phase growth of beta-Sn in the solder joint were observed by the scanning electron microscope (SEM). Moreover, a finite element analysis of Sn-3.0Ag-0.5Cu solder joints under mechanical cyclic loading was performed. The elastic-plastic- creep properties of Sn-3.0Ag-0.5Cu solder was considered in the analysis. The phase size of beta-Sn increases until some period but becomes constant after the period. The total phase size within the influence of both temperature and strain increase as number of loading cycles increasing. It is difficult to separate the phase size caused by strain from the total phase size, but it is found that the increment of the total phase size in solder joints is useful parameter to consider the phase growth process. In fatigue tests, the increment of the phase growth is affected by the loaded displacement amplitude and rate. The increment becomes larger as the displacement amplitude and rate become larger. In finite element analyses, the inelastic strain amplitude per one cycle, which occurred by displacement loading, depends on loaded displacement amplitude but doesn´t depend on displacement rate. The ratio of the plastic strain to the creep strain is changed by loaded displacement rate. Comparing the test results and the analysis results, the phase growth parameter of Sn-3.0Ag-0.5Cu solder joints is good agreement with the creep strain. Therefore the phase growth parameter is the evaluation parameter cor- responding to a creep strain.
Keywords :
creep; elasticity; fatigue cracks; finite element analysis; integrated circuit packaging; plasticity; scanning electron microscopy; silver compounds; solders; tin compounds; SEM; Sn-Ag-Cu; crack initiation; elastic-plastic-creep properties; fatigue test; finite element analysis; high-density packaging technolgy; inelastic strain amplitude; large scale integrated circuit chips; life time evaluation; mechanical cyclic loading; minilap joint type shear specimen; phase growth process; scanning electron microscope; solder joints; thermal cycle; Capacitive sensors; Creep; Fatigue; Finite element methods; Numerical analysis; Performance analysis; Scanning electron microscopy; Soldering; Temperature; Testing; Fatigue; Lead-free Solder; Phase Growth; Reliability; Sn-3.0Ag-0.5Cu;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
ISSN :
1087-9870
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2008.4544330
Filename :
4544330
Link To Document :
بازگشت