• DocumentCode
    1886578
  • Title

    Thermal test- and field cycling induced degradation and its FE-based prediction for different SAC solders

  • Author

    Dudek, Rainer ; Faust, Wolfgang ; Ratchev, Roumen ; Roellig, Mike ; Albrecht, Hans-J ; Michel, Bernd

  • Author_Institution
    Micro Mater. Center, Berlin
  • fYear
    2008
  • fDate
    28-31 May 2008
  • Firstpage
    668
  • Lastpage
    675
  • Abstract
    A study of the performance of different Sn based solder alloys applied for large to small sized solder interconnects was undertaken. From the theoretical and experimental investigations on creep, fatigue and brittle fracture behaviors the paper focuses on the low cycle fatigue performance in test and field thermal environments. Special focus was put on a newly developed highly creep resistant solder alloy "Innolot" (SnAg3.8Cu0.7Bi3.0Sbl.4Ni0.2). In addition to results of previous studies on lead free materials, particularly their long- term durability and their microstructure-properties dependence was addressed. Phenomenological models based on finite element analyses including solder creep behaviors were applied to study the component and cyclic regime dependent creep straining and creep dissipation in several joints to assess solder failure. For this purpose, creep properties of several solders were measured for ball-type joint sized specimens.
  • Keywords
    reliability theory; solders; Innolot; SAC solders; solder alloys; thermal field cycling induced degradation; thermal test cycling induced degradation; Creep; Environmentally friendly manufacturing techniques; Failure analysis; Fatigue; Finite element methods; Lead; Size measurement; Testing; Thermal degradation; Tin; Thermo-mechanical reliability; creep constitutive modeling; finite element analysis; lead-free SACxx solders; lifetime prediction; micro structural degradation; solder fatigue; test- and field cycling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-1700-1
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2008.4544332
  • Filename
    4544332