DocumentCode
1886578
Title
Thermal test- and field cycling induced degradation and its FE-based prediction for different SAC solders
Author
Dudek, Rainer ; Faust, Wolfgang ; Ratchev, Roumen ; Roellig, Mike ; Albrecht, Hans-J ; Michel, Bernd
Author_Institution
Micro Mater. Center, Berlin
fYear
2008
fDate
28-31 May 2008
Firstpage
668
Lastpage
675
Abstract
A study of the performance of different Sn based solder alloys applied for large to small sized solder interconnects was undertaken. From the theoretical and experimental investigations on creep, fatigue and brittle fracture behaviors the paper focuses on the low cycle fatigue performance in test and field thermal environments. Special focus was put on a newly developed highly creep resistant solder alloy "Innolot" (SnAg3.8Cu0.7Bi3.0Sbl.4Ni0.2). In addition to results of previous studies on lead free materials, particularly their long- term durability and their microstructure-properties dependence was addressed. Phenomenological models based on finite element analyses including solder creep behaviors were applied to study the component and cyclic regime dependent creep straining and creep dissipation in several joints to assess solder failure. For this purpose, creep properties of several solders were measured for ball-type joint sized specimens.
Keywords
reliability theory; solders; Innolot; SAC solders; solder alloys; thermal field cycling induced degradation; thermal test cycling induced degradation; Creep; Environmentally friendly manufacturing techniques; Failure analysis; Fatigue; Finite element methods; Lead; Size measurement; Testing; Thermal degradation; Tin; Thermo-mechanical reliability; creep constitutive modeling; finite element analysis; lead-free SACxx solders; lifetime prediction; micro structural degradation; solder fatigue; test- and field cycling;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Print_ISBN
978-1-4244-1700-1
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2008.4544332
Filename
4544332
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