Title :
Effect of integrated heat spreader on thermal performance and bump joint reliability for flip chip packages
Author :
Mandal, Rathin ; Mui, Y.C. ; Hengyun, Zhang
Author_Institution :
Adv. Packaging, AMD Singapore, Singapore
Abstract :
Thermal simulation had been conducted on flip chip packages with copper heat spreader and better thermal performance was achieved. The copper heat spreader was able to enhance the heat spreading from the die but thermal performance was affected due to the thin layer of thermal interface materials. It was observed that thermal performance gain can be as high as 30% from heat spreader. Ansys thermo-mechanical simulation showed that heat spreader was reduced the overall package warpage but stresses in the solder bump increased due to the stiffer heat spreader. The solder bump joint fatigue life of the heat spreader package was subsequently reduced. A sub-modeling technique was developed in a three dimensional true symmetry global model at the critical joint location to find out the fatigue life of the package.
Keywords :
copper; flip-chip devices; reliability; solders; thermal management (packaging); thermomechanical treatment; 3D true symmetry global model; Ansys thermo-mechanical simulation; bump joint reliability; copper heat spreader; flip chip packages; integrated heat spreader; package warpage; solder bump joint fatigue; thermal interface materials; thermal simulation; Copper; Fatigue; Flip chip; Heat sinks; Packaging; Temperature; Thermal conductivity; Thermal expansion; Thermal resistance; Thermal stresses; Flip chip; Heat spreader and thermo-mechanical; solder fatigue life;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1700-1
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2008.4544347