• DocumentCode
    1887181
  • Title

    Influence of fastening methods on the dynamic response and reliability assessment of PCBS in cellular phones under free drop

  • Author

    Park, Seungbae ; Al-Yafawi, Abdullah ; Yu, Da ; Kwak, Jae B. ; Lee, John ; Goo, Nam Seo

  • Author_Institution
    Dept. of Mech. Eng., State Univ. of New York at Binghamton, Binghamton, NY
  • fYear
    2008
  • fDate
    28-31 May 2008
  • Firstpage
    876
  • Lastpage
    882
  • Abstract
    In this work, free drop impact responses of printed circuit boards (PCBs) mounted in cellular phones has been investigated to assess their dynamic responses and investigate the effects of fastening methods. The digital image correction (DIC) method was used in order to measure a full-field deformation of PCBs during drop from a certain height. Three different fastening techniques which have point or edge contact between the PCBs and the casings were considered. Along with the drop impact experiments, the impact response analysis using ANSYS/LS-DYNA has been performed. To validate the numerical model, the impact response has been compared with the experimental one extracted from the DIC of the PCB. The deformations of the numerical model are well matched with the experimental ones. The effects of assembly method are investigated to assess reliability of PCBs.
  • Keywords
    cellular radio; circuit reliability; printed circuits; ANSYS-LS-DYNA; cellular phones; digital image correction method; fastening methods; free drop impact responses; printed circuit boards; Assembly; Cellular phones; Electric shock; Finite element methods; Joining processes; Laboratories; Numerical models; Printed circuits; Strain measurement; Testing; PCB; cellular phone; drop impact; fastening method; finite element method; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2008. ITHERM 2008. 11th Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-1700-1
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2008.4544358
  • Filename
    4544358