Title :
A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling
Author :
Yong Lim ; Kyoungmin Koh ; Kyungmin Kim ; Han Yang ; Juha Kim ; Youngkyun Jeong ; Seungjin Lee ; Hansoo Lee ; Sin-Hwan Lim ; Yunseok Han ; Jinwoo Kim ; Jaecheol Yun ; Seogheon Ham ; Yun-Tae Lee
Author_Institution :
Samsung Electron., Yongin, South Korea
Abstract :
A pseudo-multiple sampling technique for a low-noise CIS is implemented using a conventional column-parallel single-slope ADC structure with no additional circuitry. It is applied to a 1/3.2-inch 8Mpixel CIS. Measurement results show the technique effectively reduces dark temporal noise from 1.6e- to 1.2e- in 10 b ADC mode, and from 1.8e- to 1.1e- in 12b ADC mode.
Keywords :
CMOS image sensors; analogue-digital conversion; ADC mode; CMOS image sensor; conventional column-parallel single-slope ADC structure; dark temporal noise; low-noise CIS; pseudomultiple sampling technique; CMOS image sensors; Circuit noise; Counting circuits; Delay; Image converters; Image sampling; Noise reduction; Quantization; Sampling methods; Working environment noise;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5433971
