Electrodeposited C/sub 60//sup n-/ films : spectroscopic characterization

Summary form only given. We recently developed a simple and efficient method for preparing thin films of C/sub 60/ and C/sub 60//sup n-/, where n= 1, 2, or 3, using an electrochemical quartz crystal microbalance (EQCM). We now report the spectroscopic characterization of some of these materials with special emphasis on Cs/sub 3/C/sub 60/. We monitored the temperature dependence of the Raman spectra of selected films as well as the ESR spectra of polycrystalline materials derived from these films. These spectroscopic data along with those from similar studies of and C/sub 60//sup n-/ films exposed to air are discussed. Results C/sub 60/dm from other physical characterization of the bulk material are also presented.