Title :
Inspection of Spray on Foam Insulation (SOFI) Using Microwave and Millimeter Wave Synthetic Aperture Focusing and Holography
Author :
Case, J.T. ; Hepburn, F.L. ; Zoughi, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO
Abstract :
The Space Shuttle Columbia´s catastrophic failure is thought to have been caused by a dislodged piece of external tank spray on foam insulation (SOFI) striking and significantly damaging the left wing of the orbiter, which may have been due to a flawed section of SOFI. Microwave and millimeter wave nondestructive evaluation (NDF) methods have shown great potential detecting anomalies in SOFI such as small air voids using a horn and lens in a (real) focused configuration. Synthetic focusing methods may also be used to detect air voids in SOFI and may additionally offer the ability to locate the defect in three dimensions. To this end, two different methods were investigated; namely, frequency domain synthetic aperture focusing technique (FD-SAFT) and wide-band microwave holography. To illustrate the performance of these methods they were applied to two different SOFI samples. The results of these investigations demonstrate the capabilities of these methods for SOFI inspection
Keywords :
flaw detection; foams; microwave holography; millimetre wave imaging; space vehicles; voids (solid); FD-SAFT; SOFI inspection; Space Shuttle Columbia; air voids; defect location; frequency domain synthetic aperture focusing technique; microwave synthetic aperture focusing; millimeter wave holography; millimeter wave synthetic aperture focusing; nondestructive evaluation; spray on foam insulation; synthetic focusing methods; wideband microwave holography; Frequency domain analysis; Holography; Inspection; Insulation; Lenses; Microwave theory and techniques; Millimeter wave technology; Space shuttles; Spraying; Wideband; SOFI; foam; microwave; millimeter wave; nondestructive testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2006.328527