• DocumentCode
    1888204
  • Title

    An advanced wet cleaning system for process integration

  • Author

    Tsugane, Ken ; Tomioka, Hideki ; Shinbara, Kaoru ; Izumi, Akira

  • Author_Institution
    Device Dev. Center, Hitachi Ltd., Tokyo, Japan
  • fYear
    1997
  • fDate
    6-8 Oct 1997
  • Abstract
    We developed a single wafer wet cleaning system for cluster tools available to φ 200 mm production-line, and clarified the system´s advantages in terms of its ability to remove particles, suppress native oxide growth and adsorption of organic matter. Moreover, we showed that there were no water marks on the wafer treated in this system. Integration of the system and thermal processing chambers avoids exposure to air between each process and enable us to produce highly reliable and high quality devices
  • Keywords
    cluster tools; semiconductor technology; surface cleaning; 200 mm; adsorption of organic matter; advanced wet cleaning system; cluster tools; high quality devices; highly reliable devices; native oxide growth suppression; particles removal; process integration; production-line; single wafer wet cleaning system; thermal processing chambers; Capacitors; Cleaning; Contamination; Manufacturing processes; Moisture; Oxidation; Semiconductor films; Semiconductor thin films; Spraying; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3752-2
  • Type

    conf

  • DOI
    10.1109/ISSM.1997.664495
  • Filename
    664495