Title :
A robust digital DC-DC converter with rail-to-rail output range in 40nm CMOS
Author :
Soenen, E.G. ; Roth, Andrei ; Shi, Jack ; Kinyua, Martin ; Gaither, J. ; Ortynska, E.
Author_Institution :
TSMC, Austin, TX, USA
Abstract :
A DC-DC converter with an embedded digital controller is implemented in 40 nm CMOS. The converter including the ADC, decimator, digital filter, and DPWM occupies 0.7 mm2 of which the area occupied by the output drivers is 0.6 mm2. It achieves >90% efficiency at 200 mA load.
Keywords :
CMOS integrated circuits; DC-DC power convertors; controllers; digital control; digital filters; low-power electronics; ADC; DPWM; decimator; digital filter; embedded digital controller; rail-to-rail output range; robust digital DC-DC converter; size 40 nm; Batteries; DC-DC power converters; Digital filters; Feedback; Frequency; Pulse width modulation; Quantization; Rail to rail outputs; Robustness; Voltage;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5433987
