DocumentCode :
1888380
Title :
High-performance Quantum Dots decorated graphene/ZnO-nanowire field-emission type field-effect transistor
Author :
Zhi Tao ; Yuxuan Chen
Author_Institution :
Display Res. center, Southeast Univ., Nanjing, China
fYear :
2015
fDate :
13-17 July 2015
Firstpage :
138
Lastpage :
139
Abstract :
A novel development of combining the vacuum field-emission and nanoelectronic nanowire field-effect transistor technique in the photodetector application. In the report, Quantum Dots(QDs) are decorated onto reduced graphene oxide(RGO) fragments to overcome the low light photo responses(~0.08A/W) of pristine graphene. In addition, exploiting high light absorption of quantum dots and RGO fragments, the photo current can be amplified for scales of times by the electron injection from excited quantum dots to ZnO nanowire wrapping around RGO fragments. The device was measured under the vacuum chamber of the scanning electron microscope(SEM) by a high-precision 4-probe nano-manipulator. This work will broaden a new researching thought to realize this vacuum microelectronic photodetector.
Keywords :
II-VI semiconductors; field effect transistors; field emission; graphene; light absorption; nanowires; photoconductivity; photodetectors; photoemission; quantum dots; scanning electron microscopes; vacuum microelectronics; wide band gap semiconductors; zinc compounds; 4-probe nanomanipulator; C-ZnO; RGO; SEM; electron injection; field-emission type field-effect transistor; light absorption; light photo responses; nanoelectronic nanowire field-effect transistor technique; photo current; photodetector application; quantum dots; reduced graphene oxide; scanning electron microscope; vacuum chamber; vacuum field-emission; vacuum microelectronic photodetector; Cadmium compounds; II-VI semiconductor materials; Nanobioscience; Photodetectors; Quantum dots; Scanning electron microscopy; Zinc oxide; Quantum Dots; RGO fragments; ZnO nanowire; photodetector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4673-9356-0
Type :
conf
DOI :
10.1109/IVNC.2015.7225559
Filename :
7225559
Link To Document :
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