Title :
Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit
Author :
Meterelliyoz, Mesut ; Goel, Ankush ; Kulkarni, Jaydeep P. ; Roy, Kaushik
Author_Institution :
Intel, Hillsboro, OR, USA
Abstract :
We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm test hip demonstrate the effectiveness of the sensor.
Keywords :
calibration; electric sensing devices; integrated circuit testing; low-power electronics; random processes; global PVT variations; on-chip calibration circuit; random process variations sensor; replica bias circuit; robust low voltage high sensitivity sensor; Calibration; Circuits; Low voltage; Random processes; Robustness; Semiconductor device measurement; Sensor phenomena and characterization; Switches; Testing; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5433991
