Title :
In situ delay-slack monitor for high-performance processors using an all-digital self-calibrating 5ps resolution time-to-digital converter
Author :
Fick, David ; Liu, Nian ; Zhiyoong Foo ; Fojtik, Matthew ; Jae-sun Seo ; Sylvester, Dennis ; Blaauw, D.
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
We present a minimally invasive in situ delay-slack monitor that directly measures the timing margins on critical timing signals, allowing margins due to both global and local PVT variations to be removed.
Keywords :
convertors; microprocessor chips; 5ps resolution time-to-digital converter; all-digital time-to-digital converter; high-performance processors; in situ delay-slack monitor; self-calibrating time-to-digital converter; timing margin; timing signals; Calibration; Capacitors; Clocks; Counting circuits; Delay; Monitoring; Pulse measurements; Sampling methods; Timing; Virtual colonoscopy;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5433996
