Photocell Surface Contamination Level Detection Instrument Based on the Microprocessor

This paper presented a method to test the photocell surface Contamination level, developed an instrument for detecting the contamination, which uses the microprocessor to decide which photocell is contamination. Inspection of photocell surface contamination is detected on the surface area of solid Comparison test to determine the use of photovoltaic cells work under different light conditions, verifying the design of the optical cell of the feasibility of the proposed method. And this instrument includes such components: microprocessor, photoelectric sensor, A/D converter and display. If the level of acquired signal is not equal to zero, then Photocell is contaminated. The experiments show that the design can determine whether the contaminated surface of photovoltaic cells, as well as the degree of pollution can obtain the more accurate measurement. This instrument can meet the photocell contamination test requirements, and have the features of high performance price ratio.