Title :
A microcontroller-based PVT control system for a 65nm 72Mb synchronous SRAM
Author :
Eid, S.T. ; Whately, Morgan ; Krishnegowda, Sandeep
Author_Institution :
Cypress Semicond., San Jose, CA, USA
Abstract :
We present a manufacturable scheme for managing PVT variations and controlling speed and power consumption by using an on-chip microcontroller and a temperature sensor. The system varies body-bias and power supplies of the memory core and periphery logic independently. The circuit occupies 0.32 mm2 (0.4%) of a 72 Mb SRAM test-chip in a 65 nm CMOS process.
Keywords :
CMOS digital integrated circuits; SRAM chips; microcontrollers; temperature sensors; CMOS process; microcontroller-based PVT control system; on-chip microcontroller; periphery logic; power consumption; size 65 nm; storage capacity 72 Mbit; synchronous SRAM; temperature sensor; Circuit testing; Control systems; Energy consumption; Energy management; Manufacturing; Microcontrollers; Power system management; Random access memory; Temperature control; Temperature sensors;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5433998
