Title :
New sensing application to diagnose power semiconductor aging in actuator power drive systems
Author :
Ali, Irfan N. ; Ginart, Antonio E. ; Goldin, Jonathan W. ; Kalgren, Patrick W. ; Roemer, Michael J. ; Poll, Scott
Author_Institution :
Impact Technol., Rochester, NY, USA
Abstract :
This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.
Keywords :
actuators; ageing; electric current measurement; electric drives; frequency response; insulated gate bipolar transistors; power semiconductor devices; actuator power drive systems; frequency response; power semiconductor aging; sensing application; wideband AC current sensor; Aging; Capacitance; Equations; Insulated gate bipolar transistors; Mathematical model; Temperature measurement; Transistors;
Conference_Titel :
Aerospace Conference, 2012 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4577-0556-4
DOI :
10.1109/AERO.2012.6187388
