DocumentCode :
188865
Title :
A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs
Author :
Chaohui Du ; Guoqiang Bai
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2014
fDate :
11-13 Sept. 2014
Firstpage :
270
Lastpage :
275
Abstract :
Silicon physical unclonable function (PUF) exploits random variations in the manufacturing process to extract unique information for each chip. As one of the most popular techniques to implement a PUF, ring oscillator based PUF (RO-PUF) is easy to implement for both ASIC and FPGA. However, RO-PUF suffers from the lack of reliability caused by temperature and supply voltage variations. In this paper, we proposed a post-processing technique to improve the reliability of RO-PUF. The main idea is that we allow RO-PUF to generate unstable responses as long as we can find means to filter them out during enrollment. Our proposed scheme generates a signal indicating whether the response is stable, and we could filter out unstable challenge response pairs depending on this signal during enrollment. Experimental results showed that the error rate of challenge response pairs enrolled by our proposed scheme was reduced from 19.94% to 0.35% due to voltage variation, and it was reduced from 6.65% to 0.10% due to temperature variation.
Keywords :
application specific integrated circuits; field programmable gate arrays; logic design; oscillators; ASIC; FPGA; RO-PUF; manufacturing process; post-processing technique; response pairs; ring oscillator; silicon physical unclonable function; supply voltage variation; temperature variation; Error analysis; Field programmable gate arrays; Radiation detectors; Reliability; Ring oscillators; Temperature sensors; Wires; challenge response pair; error rate; physical unclonable function; reliability; ring oscillator; temperature variation; voltage variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Technology (CIT), 2014 IEEE International Conference on
Conference_Location :
Xi´an
Type :
conf
DOI :
10.1109/CIT.2014.145
Filename :
6984665
Link To Document :
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