Title :
A fractional-sampling-rate ADC-based CDR with feedforward architecture in 65nm CMOS
Author :
Tyshchenko, Oleksiy ; Sheikholeslami, Ali ; Tamura, H. ; Tomita, Yasumoto ; Yamaguchi, Hitoshi ; Kibune, Masaya ; Yamamoto, Takayuki
Author_Institution :
Univ. of Toronto, Toronto, ON, Canada
Abstract :
This paper presents a fractional-sampling-rate (FSR) CDR that blindly samples the received signal with an ADC at 1.45x the data rate and estimates the data phase using a feedforward architecture for clock and data recovery. The presented architecture reduces the ADC power by 27.3% compared to a 2x CDR. Measurements confirm that the FSR CDR recovers data with BER<1013 at 6.875 Gb/s from samples taken at 10 GS/S. The test-chip, implemented in 65 nm CMOS, occupies 0.3683 mm2, and consumes 175.2 mW.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; CMOS; clock recovery; data phase; data recovery; feedforward architecture; fractional-sampling-rate ADC-based CDR; fractional-sampling-rate CDR; received signal; size 65 nm; Bit error rate; Clocks; Feedforward systems; Filters; Frequency; Jitter; Phase estimation; Sampling methods; Signal analysis; Testing;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5434004