DocumentCode
1889148
Title
Stability investigation of high aspect ratio n-type silicon field emitter arrays
Author
Bachmann, M. ; Dams, F. ; Dusberg, F. ; Hofmann, M. ; Pahlke, A. ; Langer, C. ; Lawrowski, R. ; Prommesberger, C. ; Schreiner, R.
Author_Institution
R&D Detectors, KETEK GmbH, Munich, Germany
fYear
2015
fDate
13-17 July 2015
Firstpage
204
Lastpage
205
Abstract
Electron sources based on silicon field emitter arrays, produced in processes based on semiconductor technology, are good candidates for a miniaturized X-ray source. A key parameter for this application is the stability of the X-ray photon flux and, thus, the emission current. In the present work we have investigated the influence of the residual gas pressure and a resistor in series on the emission stability of a high aspect ratio n-type silicon emitter array with hybrid extraction electrode. An increase of current fluctuations was found for pressures above 10-6 mbar. High resistances in series to the emitter array alter the emission characteristics, but greatly suppress spikes in the emission current and improve its stability. This, however, strongly depends on the bias point. The field enhancement factor is not affected by the resistance. In a long term measurement the emission current was found to be constant after an initial phase of degradation.
Keywords
X-ray production; elemental semiconductors; field emitter arrays; particle beam stability; silicon; Si; X-ray photon flux stability; electron source; emission current; emission stability; high aspect ratio field emitter array; miniaturized X-ray source; residual gas pressure; semiconductor technology; Current measurement; Field emitter arrays; Resistance; Resistors; Silicon; Stability analysis; Thermal stability; XRF spectroscopy; emission current stability; field emitter array; semiconductor field emission; silicon tips;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
Conference_Location
Guangzhou
Print_ISBN
978-1-4673-9356-0
Type
conf
DOI
10.1109/IVNC.2015.7225584
Filename
7225584
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