Title :
On the Inadequacy of the overlay method for characterizing a conductor-backed material using free-space measurements
Author :
Fenner, Raenita ; Rothwell, Edward J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
The overlay method is used successfully to measure the properties of conductorbacked materials using waveguide probes. However, it is shown here that the method cannot be used with free-space systems that assume plane wave excitation. Since every combination of overlay materials provides exactly the same information about the underlying unknown material, there is insufficient information for obtaining the desired material properties.
Keywords :
electromagnetic waves; probes; waveguides; conductor backed material; free space measurement; overlay method; plane wave excitation; waveguide probes; Conductors; Magnetic field measurement; Magnetic fields; Materials; Permittivity; Permittivity measurement; Reflection;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-4967-5
DOI :
10.1109/APS.2010.5561729
