DocumentCode
1889200
Title
On the Inadequacy of the overlay method for characterizing a conductor-backed material using free-space measurements
Author
Fenner, Raenita ; Rothwell, Edward J.
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2010
fDate
11-17 July 2010
Firstpage
1
Lastpage
4
Abstract
The overlay method is used successfully to measure the properties of conductorbacked materials using waveguide probes. However, it is shown here that the method cannot be used with free-space systems that assume plane wave excitation. Since every combination of overlay materials provides exactly the same information about the underlying unknown material, there is insufficient information for obtaining the desired material properties.
Keywords
electromagnetic waves; probes; waveguides; conductor backed material; free space measurement; overlay method; plane wave excitation; waveguide probes; Conductors; Magnetic field measurement; Magnetic fields; Materials; Permittivity; Permittivity measurement; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
Conference_Location
Toronto, ON
ISSN
1522-3965
Print_ISBN
978-1-4244-4967-5
Type
conf
DOI
10.1109/APS.2010.5561729
Filename
5561729
Link To Document