• DocumentCode
    1889494
  • Title

    An abnormal thermal field emission point electron source

  • Author

    Ptitsin, V.E.

  • Author_Institution
    Inst. for Anal. Instrum. of the Russian, St. Petersburg, Russia
  • fYear
    2015
  • fDate
    13-17 July 2015
  • Firstpage
    242
  • Lastpage
    243
  • Abstract
    A study of the field emission properties of ZrO2/W nanoheterostructures (NS) is presented. The NS was represented by a thin (~10 nm) ZrO2 layer at the tip of a needle-shaped W<;100> and W<;111> microcrystals. It has been revealed that at temperatures NS substance within 1950K to 2150K the NS shows an abnormally high normalized brightness (up to ~ 106 A/(cm2 sr V)) and high stability of field emission properties. The revealed phenomenon of a sharp rise in emissive ability of the ZrO2/W NS in a certain range of ZrO2/W layer thicknesses and NS substance temperatures was called “abnormal thermal field emission” (ATFE). A phenomenological model of the physical mechanism of the ATFE from planar nanoheterostructured surfaces is offered.
  • Keywords
    electron sources; field emission; vacuum breakdown; ATFE; ZrO2-W; abnormal thermal field emission point electron source; field emission properties; needle-shaped microcrystals; phenomenological model; planar nanoheterostructured surfaces; temperature 1950 K to 2150 K; thin layer; Current density; Dielectric films; Dielectrics; Electron sources; Stability analysis; Thermal stability; high current density electron source; nanofilms; nanoheterostructures; thermal field emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4673-9356-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2015.7225597
  • Filename
    7225597