DocumentCode
1889494
Title
An abnormal thermal field emission point electron source
Author
Ptitsin, V.E.
Author_Institution
Inst. for Anal. Instrum. of the Russian, St. Petersburg, Russia
fYear
2015
fDate
13-17 July 2015
Firstpage
242
Lastpage
243
Abstract
A study of the field emission properties of ZrO2/W nanoheterostructures (NS) is presented. The NS was represented by a thin (~10 nm) ZrO2 layer at the tip of a needle-shaped W<;100> and W<;111> microcrystals. It has been revealed that at temperatures NS substance within 1950K to 2150K the NS shows an abnormally high normalized brightness (up to ~ 106 A/(cm2 sr V)) and high stability of field emission properties. The revealed phenomenon of a sharp rise in emissive ability of the ZrO2/W NS in a certain range of ZrO2/W layer thicknesses and NS substance temperatures was called “abnormal thermal field emission” (ATFE). A phenomenological model of the physical mechanism of the ATFE from planar nanoheterostructured surfaces is offered.
Keywords
electron sources; field emission; vacuum breakdown; ATFE; ZrO2-W; abnormal thermal field emission point electron source; field emission properties; needle-shaped microcrystals; phenomenological model; planar nanoheterostructured surfaces; temperature 1950 K to 2150 K; thin layer; Current density; Dielectric films; Dielectrics; Electron sources; Stability analysis; Thermal stability; high current density electron source; nanofilms; nanoheterostructures; thermal field emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
Conference_Location
Guangzhou
Print_ISBN
978-1-4673-9356-0
Type
conf
DOI
10.1109/IVNC.2015.7225597
Filename
7225597
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