Title :
Modeling, estimating and predicting the packet-level Bit Error Rate process in IEEE 802.15.4 LR-WPANs using Hidden Markov Models
Author :
Ilyas, Muhammad U. ; Radha, Hayder
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI
Abstract :
This paper describes a stochastic wireless channel model that captures the behavior of the packet-level bit error rate (BER) and the link quality indication (LQI) processes. The model is based on a discrete-time hidden markov model (HMM) whose hidden states correspond to different BERs, and whose observable states correspond to different LQI values. We use the Baum-Welch algorithm to train the HMM. The data required as input to the training phase is captured experimentally using IEEE 802.15.4 compliant Crossbow MICAz motes. We demonstrate the HMM-based channel model´s (HCM) utility and versatility by three applications. In the first we use it to synthesize traces whose properties closely resemble those of the training data. This application simultaneously demonstrates the HCM´s correctness as well. In the second application we demonstrate the HCM´s ability to estimate a received packet´s BER based on the LQI with which it was received. In the third application we demonstrate the HCM´s ability to predict the BER to which future packets will be subjected. For evaluation purpose we restrict our prediction to the next packet.
Keywords :
error statistics; hidden Markov models; personal area networks; stochastic processes; wireless channels; Baum-Welch algorithm; Crossbow MICAz motes; IEEE 802.15.4 LR-WPAN; discrete-time HMM; hidden Markov models; link quality indication process; packet-level bit error rate process; stochastic wireless channel model; Bit error rate; Cyclic redundancy check; Hidden Markov models; Physical layer; Predictive models; Semiconductor device measurement; State estimation; Stochastic processes; Training data; Wireless sensor networks;
Conference_Titel :
Information Sciences and Systems, 2009. CISS 2009. 43rd Annual Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-2733-8
Electronic_ISBN :
978-1-4244-2734-5
DOI :
10.1109/CISS.2009.5054724